We
have access to a JOEL JSM-6390LV Scanning Electron Microscope (SEM) within the Science and Research Facility at ITT Dublin. Its a high performance general purpose SEM and lets you go down 8 times below magnification. Report generation can be easily produced using the SMile View software. The low vacuum 6390LV SEM, has the low vacuum SEM mode in addition to the conventional high vacuum SEM mode. The low vacuum SEM lets you observe a non-conductive specimen as is and then analyze with EDS. Wet specimens can be observed quickly with JOEL's patented freeze dry method in the LV SEM.
Applications
Combining state-of-the-art scanning electron microscopy and microanalysis can help identify failure analysis, fracture modes, microstructural analysis, corrosion damage and pitting. The JSM-6390LV SEM also measures the surface morphology of conducting and non conducting materials by analyzing BSE and SE. The Chemical compositions are analyzed by EDS.
Technical Specification
Resolution: 3nm at 30Kv (high vacuum mode), 4nm at 30 Kv (low vacuum mode)
Magnification: 5X to 300,00X (at 10kV or lower)
Image Mode: Secondary Electron & Back Scattered Image
Sample Stage: X=80mm, Y=40m, Z=5mm to 48mm, Tilt: -10o to +90o, Rotation - 360o
Maximum Specimen: 150mm diameter
LV Pressure: 1 to 270 Pa
Accessories: Detectors (Secondary Electron (SE), Back Scattered Electron (BSE) and Energy Dispersive Spectroscopy (EDS), Coating unit: Au or Pt metal
